Date of Award

2-27-2019

Document Type

Thesis

Publisher

Santa Clara : Santa Clara University, 2019.

Degree Name

Master of Science (MS)

Departments

Mechanical Engineering

First Advisor

Panthea Sepehrband

Abstract

Development of metallic components with desired properties for the new generation of applications requires precise design of grain structure. One of the most effective techniques for manipulating grain structure is by controlling the recrystallization process. Although recrystallization has been studied for many years, its proper and fast quantification is still a challenge. This work develops a new image analysis technique for quantification of recrystallization, as an alternative to intensive and expensive electron backscatter diffraction (EBSD) analysis. The image analysis program run on an optical micrograph, detect recrystallized regions and report: fraction recrystallized, average grain size and distribution. To examine the accuracy of the program algorithm, the technique has been implemented on AA5052 aluminum alloy annealed to various extents. The image analysis results were compared with the quantified results obtained through Tensile and Microhardness tests. The results show good quantitative agreement between the model calculations and the results from the experimental tests.

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