Secondary electron emission from freely supported nanowires

Authors

Makoto Suzuki
Kazuhiro Kumagai
Takashi Sekiguchi
Alan M. Cassell
Tsutomu Saito
Cary Y. Yang, Santa Clara UniversityFollow

Document Type

Article

Publication Date

12-1-2008

Publisher

American Institute of Physics Publishing

Abstract

We present secondary electron (SE) emission results from freely supported carbon/silicon nitride (Si₃N₄) hybrid nanowires using scanning electron microscopy. We found that, contrary to bulk materials, the SE emission from insulating or electrically isolated metallic nanowires is strongly suppressed by the penetrating beam. A mechanism of the SE suppression by the positive specimen charging is proposed, which is based on a total emission yield calculation using the Monte Carlo technique. This finding provides an important basis for studying low-energy electron emission from nanostructures under a penetrating electron beam.

Comments

Copyright © 2008 American Institute of Physics Publishing. Reprinted with permission.

Recommended Citation

M. Suzuki, K. Kumagai, T. Sekiguchi, A.M. Cassell, T. Saito, and C.Y. Yang, “Secondary electron emission from freely supported nanowires,” Journal of Applied Physics 104, 114306 (6 pp) (2008). https://doi.org/10.1063/1.3032910