Evaluation of 3D Carbon Nanotube Composite Atomic Force Microscopy Probes Fabricated with Ion Flux Molding
Document Type
Article
Publication Date
12-2016
Publisher
American Scientific Publishers
Abstract
The performance of carbon nanotube-carbon nanotube composite (CNT/CNT composite) atomic force microscopy (AFM) probes aligned by using ion flux molding (IFM) processing is compared to that of conventional Si probes in atomic force microscopy (tapping mode). Comparison data reveal that IFM treated CNT/CNT composite probes improve image accuracy, tip longevity and allow higher aspect ratio imaging of 3D surface features.
Recommended Citation
Chesmore, G. E., Hung, K.-H., Roque, C., & Barber Jr., R. P. (2016). Evaluation of 3D Carbon Nanotube Composite Atomic Force Microscopy Probes Fabricated with Ion Flux Molding. Journal of Advanced Microscopy Research, 11(2), 145–148.
