Document Type
Article
Publication Date
8-28-2023
Publisher
American Physical Society
Abstract
We measured the nuclear-recoil ionization yield in silicon with a cryogenic phonon-sensitive gram-scale detector. Neutrons from a monoenergetic beam scatter off of the silicon nuclei at angles corresponding to energy depositions from 4 keV down to 100 eV, the lowest energy probed so far. The results show no sign of an ionization production threshold above 100 eV. These results call for further investigation of the ionization yield theory and a comprehensive determination of the detector response function at energies below the keV scale.
Recommended Citation
SuperCDMS Collaboration, Albakry, M. F., Alkhatib, I., Alonso, D., Amaral, D. W. P., Aralis, T., Aramaki, T., Arnquist, I. J., Ataee Langroudy, I., Azadbakht, E., Banik, S., Bathurst, C., Bhattacharyya, R., Brink, P. L., Bunker, R., Cabrera, B., Calkins, R., Cameron, R. A., Cartaro, C., … Runge, J. (2023). First Measurement of the Nuclear-Recoil Ionization Yield in Silicon at 100 eV. Physical Review Letters, 131(9), 091801. https://doi.org/10.1103/PhysRevLett.131.091801
Comments
© 2023 American Physical Society. Reprinted with permission.