"Quasiparticle Transport in Thick Aluminum Films Coupled to Tungsten Tr" by J. J. Yen, J. M. Kreikebaum et al.
 

Quasiparticle Transport in Thick Aluminum Films Coupled to Tungsten Transition Edge Sensors

Document Type

Article

Publication Date

12-29-2015

Publisher

Springer

Abstract

We have fabricated and characterized test devices of a new geometry for cryogenic dark matter search superconducting sensors. The modified design uses the same photolithography masks used to fabricate earlier-generation devices, but with the Al and W films deposited in reverse order. This inverted film geometry (Al over W instead of our conventional W over Al) offers a simplified and robust way to dramatically increase the thickness of Al energy-collecting fins coupled to thin W-TESs—tungsten-transition edge sensors. Data are presented from experiments with inverted geometry test devices exposed to X-rays from a NaCl fluorescence source. The results are compared to data obtained with similar devices fabricated in the standard, non-inverted geometry.

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