Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten Transition-Edge Sensors

Authors

J. J. Yen
B. Shank
Betty A. Young, Santa Clara UniversityFollow
Blas Cabrera
P. L. Brink
M. Cherry
J. M. Kreikebaum
R. Moffatt
P. Redl
A. Tomada
E. C. Tortorici

Document Type

Article

Publication Date

10-20-2014

Publisher

American Institute of Physics

Abstract

We report on experimental studies of phonon sensors which utilize quasiparticle diffusion in thin aluminum films connected to tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al films in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al films using a simple diffusion equation approach. These studies allow the design of phonon sensors with improved performance.

Comments

Copyright © 2014 American Institute of Physics Publishing. Reprinted with permission.

Recommended Citation

Yen, J. J., Shank, B., Young, B. A., Cabrera, B., Brink, P. L., Cherry, M., Kreikebaum, J. M., Moffatt, R., Redl, P., Tomada, A., & Tortorici, E. C. (2014). Measurement of quasiparticle transport in aluminum films using tungsten transition-edge sensors. Applied Physics Letters, 105(16), 163504. https://doi.org/10.1063/1.4899130